MyLam / Product Explorer |
參考資料:myLam https://mylam.lamresearch.com
MyLam|帳號申請|提升對機器敏銳度的好資源
沒有人天生就擁有機器的修復技能,
這需要有參考資料,
只需要申請帳號,就可以享用這些資源
帳號申請步驟如下:
MyLam 帳號申請步驟 |
申請過,就可以盡情探索Lam 產品手冊
MyLam / Product Explorer |
參考資料:myLam https://mylam.lamresearch.com
沒有人天生就擁有機器的修復技能,
這需要有參考資料,
只需要申請帳號,就可以享用這些資源
帳號申請步驟如下:
MyLam 帳號申請步驟 |
申請過,就可以盡情探索Lam 產品手冊
Load port |
keywords: purge LP,
項目 | Purge LP | LP |
全名稱 | Purge Load port | Load port |
製造商 | Local vendor() | TDK () |
功能 | 降低FOUP內部濕度 | 1. 讀取FOUP ID 2. 開關FOUP |
機台位置 | LP蓋板前那片結構 | 3F機台前方FOUP 放置區 |
基本作動 | 1 Load purge 1.1 Gas flow 1.2 Humidity 1.3 Inlet pressure 1.4 Outlet pressure 1.5 Temperature 2 Continue purge 2.1 Gas flow 2.2 Humidity 2.3 Inlet pressure 2.4 Outlet pressure 2.5 temperature 3 Unload purge 3.1 Gas flow 3.2 Humidity 3.3 Inlet pressure 3.4 Outlet pressure 3.5 temperature | 1. 讀取FOUP ID (RFID) 2. Clamp 3. Dock in (shuttle in) 4. Vacuum on 5. Latch open 6. Door open 7. Door down 8. ------------ 以上open door 9. Door up 10. Door close 11. Latch off 12. Vacuum off 13. Dock out (shuttle out) 14. Clamp up 15. Clamp backward 16. Clamp down 17. ----------- 9-16 close door |
好發FDC 之 spec | 1. Outlet pressure 2. Gas flow | NA |
好發之Alarm | NA | Command reply error 2. Dummy replacement(宿疾) 3. 指撥開關(對照alarm表) |
Load port 的位置 |
Keywords: spectrum, 光譜, OES, IB7
參考資料:202-037878-001, Rev. G, Endpoint Detection
用中文簡單說:質譜儀能夠提供高精度的氣體分析結果,這使得在蝕刻過程中氣體相變化的特定時刻被準確地檢測。當特定氣體成分的峰值或變化率達到預定值時,可以判定蝕刻終點已經達到。
Every step within a wafer-processing recipe has a number of user-defined parameters for controlling the process of endpoint detection. In order to define a step as an endpoint step, you must select the parameter variable named Step Type for that step as EndPT. Otherwise, all optical emission spectra (OES) parameters are processed but no endpoint detection is performed.
There are four major groups of user-defined parameters used by the OES system to perform an endpoint detection test. These four parameter groups are integration bands, basis functions, filters, and algorithms. All these four parameters are defined in the Editors\Endpoint Param window. See Figure 7.
OES 設定的主要參數 |
An integration band (IB) defines a contiguous wavelength band in the spectrograph. The value of the IB is the sum of the spectrographic intensity in the defined contiguous wavelength band.
An IB is defined by providing a wavelength position and a width band centered at the selected wavelength. You can define up to eight IBs (IB1, IB2, and so forth).
Once an IB is defined, its value can then be used by the basic function. The valid range of the wavelength is from 200 nm to 900 nm.
For example, if a wavelength of 256 nm is chosen and the width is 6 for IB1, then the value of IB1is obtained by adding all the intensity values from the contiguous band of 253 nm to 259 nm.
2. Basis Functions
用中文簡單說:看出此步驟偵測哪個IB訊號,或代數計算之設定
A basis function (BF) combines one or more IBs in a simple algebraic equation. The value of a basis function (endpoint signal) at each sampling interval is used as basis for endpoint detection.
The OES system provides several predefined algebraic equations for selection. In addition, you can also specify user-defined equations. The predefined algebraic equations are:
IB1
IB2
IB1 – IB2
IB1 / IB2
User defined
An example of a user-defined basic function is as follows:
0.5 * IB1 + 0.9 * IB2
Filters are used to smooth out the incoming data and to reduce noise. You can apply the filters individually to integration bands and/or basis functions.
Fourteen different types of filters are defined in the current version of OES system:
For each endpoint step, select an algorithm for the OES system to use for detecting the occurrence of endpoint. There are ten pre-defined algorithms for selection in the current OES system—Value Change,Percent Change, Value Slope, Percent Slope, Direction Detection, Interferometer, Peak and Valley, Twin Peaks, Percent Slope Change, and WAC Detection.
In general, the process of finding the endpoint involves three stages: Delay Time, Normalization Time, and Endpoint Detecting.
怎麼確認OES設定 |
Keywords: OES, Endpoint, EP
答:Maximum End point alarm (設定時間內無法偵測到蝕刻終點。)
1. 簡述EPD之功用
答:偵測蝕刻終點;End point detector利用波長偵測蝕刻終點
2. 在機台上哪個是 End point detector (光諎原理)
答: OES (spectrometers used for optical emission spectroscopy)
用於光學發射光譜的光譜儀
OES簡介 |
3. Recipe step type 設定在哪?
答:Recipe window/ recipe / Step type 為 EndPt
1.Stable: 各參數都符合soft tolerance才會進入下一步,否則就會出現stable fail alarm.
2.Time: process 時間,設定此step的時間,以秒為單位,。
3.EndPt:endpoint,蝕刻結點,藉由OES設備,偵測光譜訊號來結束這step。
4. Recipe step process time 設定在哪?
答:Recipe window/ recipe / Process time (以秒為單位)
Recipe 參數設定 |
StepType & process time 設定 |
Keyword: pressure, manometer, 壓力
「壓力」是作用在物體表面上垂直做功時每單位面積力的大小,常用的單位換算有 mTorr、Kg/cm2、Bar(Pa)及 psi 等。
在海平面上測得的空氣壓力約為 1 kg/cm2,其來源是大氣層中空氣的重量,因此又稱為大氣壓力,常以 atm 表示,1 kg/cm2 約等同於 1 大氣壓力(1 atm)。實際的大氣壓力則會隨著海拔高度、溫度及天氣等因素而有所變動。
絕對壓力的壓力值 =絕壓值,以絕對壓力為基準的壓力錶 =絕對壓力錶
ex. CM1, CM2, CM3
相對壓力的壓力值 =錶壓值,以相對壓力為基準的壓力錶 =相對壓力錶
ex. MFC transducer, He pressure gauge 等
No. | 縮寫 | 全名 | 量測範圍 | Interlock switch | 如何應用? |
1 | CM1 | Process manometer | 0 - 100 mTorr | NA | Chamber 壓力小於100mT, 用CM1讀 |
2 | CM2 | Chamber manometer | 0 - 10 Torr | 0.1V (100mT) 0.5V (500mT) | Chamber 壓力大於100mT, 用CM2讀 |
3 | CM3 | Foreline Manometer | 0 - 10 Torr | 1V (1000mT) 10V (non use) | Foreline壓力大於1000mT, PV close |
4 | CM4 | Backside helium UPC | 0 - 50 psi | NA | 需pump down, 確認pressure & flow 零點 |
5 | TM | Pressure gauge | 0 – 760,000 mT | NA | VTM gauge Normal 95mT |
6 | AL1 | Hasting gauge | 0 – 930,000 mTorr | NA | Airlock gauge |